有的!
Finn Jensen, Burn-In: An Engineering Approach to the Design and Analysis of Burn-In Procedures, 1982
Finn Jensen, Electronic Component Reliability, 2001
IEC 61163-1, Reliability stress screening –Part 1:Repairable assemblies manufactured in lots, 2006
都有提到如何應用Markov model於求得FAILURE FREE TIME,以決定零組件之篩選時間